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USB: digi_acceleport: remove bogus disconnect test in close 

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
This commit is contained in:
Johan Hovold 2013-03-21 12:36:30 +01:00 committed by Greg Kroah-Hartman
parent 1bc77f4df6
commit 28e679ae6f
1 changed files with 38 additions and 40 deletions
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6
drivers/usb/serial/digi_acceleport.c
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@ -1149,7 +1149,6 @@ static void digi_close(struct usb_serial_port *port)
if (port->serial->disconnected)
goto exit;
if (port->serial->dev) {
/* FIXME: Transmit idle belongs in the wait_unti_sent path */
digi_transmit_idle(port, DIGI_CLOSE_TIMEOUT);
@ -1185,8 +1184,8 @@ static void digi_close(struct usb_serial_port *port)
ret = digi_write_oob_command(port, buf, 20, 0);
if (ret != 0)
dev_dbg(&port->dev, "digi_close: write oob failed, ret=%d\n", ret);
dev_dbg(&port->dev, "digi_close: write oob failed, ret=%d\n",
ret);
/* wait for final commands on oob port to complete */
prepare_to_wait(&priv->dp_flush_wait, &wait,
TASK_INTERRUPTIBLE);
@ -1195,7 +1194,6 @@ static void digi_close(struct usb_serial_port *port)
/* shutdown any outstanding bulk writes */
usb_kill_urb(port->write_urb);
}
exit:
spin_lock_irq(&priv->dp_port_lock);
priv->dp_write_urb_in_use = 0;