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mtd: nand: mxc: fix obiwan error in mxc_nand_v[12]_ooblayout_free() functions
commita894cf6c5a
("mtd: nand: mxc: switch to mtd_ooblayout_ops") introduced a regression accessing the OOB area from the mxc_nand driver due to an Obiwan error in the mxc_nand_v[12]_ooblayout_free() functions. They report a bogus oobregion { 64, 7 } which leads to errors accessing bogus data when reading the oob area. Prior to the commit the mtd-oobtest module could be run without any errors. With the offending commit, this test fails with results like: |Running mtd-oobtest | |================================================= |mtd_oobtest: MTD device: 5 |mtd_oobtest: MTD device size 524288, eraseblock size 131072, page size 2048, count of eraseblocks 4, pages per eraseblock 64, OOB size 64 |mtd_test: scanning for bad eraseblocks |mtd_test: scanned 4 eraseblocks, 0 are bad |mtd_oobtest: test 1 of 5 |mtd_oobtest: writing OOBs of whole device |mtd_oobtest: written up to eraseblock 0 |mtd_oobtest: written 4 eraseblocks |mtd_oobtest: verifying all eraseblocks |mtd_oobtest: error @addr[0x0:0x19] 0x9a -> 0x78 diff 0xe2 |mtd_oobtest: error @addr[0x0:0x1a] 0xcc -> 0x0 diff 0xcc |mtd_oobtest: error @addr[0x0:0x1b] 0xe0 -> 0x85 diff 0x65 |mtd_oobtest: error @addr[0x0:0x1c] 0x60 -> 0x62 diff 0x2 |mtd_oobtest: error @addr[0x0:0x1d] 0x69 -> 0x45 diff 0x2c |mtd_oobtest: error @addr[0x0:0x1e] 0xcd -> 0xa0 diff 0x6d |mtd_oobtest: error @addr[0x0:0x1f] 0xf2 -> 0x60 diff 0x92 |mtd_oobtest: error: verify failed at 0x0 [...] Signed-off-by: Lothar Waßmann <LW@KARO-electronics.de> Fixes:a894cf6c5a
("mtd: nand: mxc: switch to mtd_ooblayout_ops") Cc: <stable@vger.kernel.org> Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
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@ -943,7 +943,7 @@ static int mxc_v2_ooblayout_free(struct mtd_info *mtd, int section,
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struct nand_chip *nand_chip = mtd_to_nand(mtd);
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int stepsize = nand_chip->ecc.bytes == 9 ? 16 : 26;
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if (section > nand_chip->ecc.steps)
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if (section >= nand_chip->ecc.steps)
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return -ERANGE;
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if (!section) {
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