mirror of https://gitee.com/openkylin/linux.git
drm/i915: Implement the intel_dp_autotest_edid function for DP EDID complaince tests
Updates the EDID compliance test function to perform the analyze and react to the EDID data read as a result of a hot plug event. The results of this analysis are handed off to userspace so that the userspace app can set the display mode appropriately for the test result/response. The compliance_test_active flag now appears at the end of the individual test handling functions. This is so that the kernel-side operations can be completed without the risk of interruption from the userspace app that is polling on that flag. V2: - Addressed mailing list feedback - Removed excess debug messages - Removed extraneous comments - Fixed formatting issues (line length > 80) - Updated the debug message in compute_edid_checksum to output hex values instead of decimal V3: - Addressed more list feedback - Added the test_active flag to the autotest function - Removed test_active flag from handler - Added failsafe check on the compliance test active flag at the end of the test handler - Fixed checkpatch.pl issues V4: - Removed the checksum computation function and its use as it has been rendered superfluous by changes to the core DRM EDID functions - Updated to use the raw header corruption detection mechanism - Moved the declaration of the test_data variable here V5: - Update test active flag variable name to match the change in the first patch of the series. - Relocated the test active flag declaration and initialization to this patch V6: - Updated to use the new flag for raw EDID header corruption - Removed the extra EDID read from the autotest function - Added the edid_checksum variable to struct intel_dp so that the autotest function can write it to the sink device - Moved the update to the hpd_pulse function to another patch - Removed extraneous constants V7: - Fixed erroneous placement of the checksum assignment. In some cases such as when the EDID read fails and is NULL, this causes a NULL ptr dereference in the kernel. Bad news. Fixed now. V8: - Updated to support the kfree() on the EDID data added previously V9: - Updated for the long_hpd flag propagation V10: - Updated to use actual checksum from the EDID read that occurs during normal hot plug path execution - Removed variables from intel_dp struct that are no longer needed - Updated the patch subject to more closely match the nature and contents of the patch - Fixed formatting problem (long line) V11: - Removed extra debug messages - Updated comments to be more informative - Removed extra variable V12: - Removed the 4 bit offset of the resolution setting in compliance data - Changed to DRM_DEBUG_KMS instead of DRM_DEBUG_DRIVER Signed-off-by: Todd Previte <tprevite@gmail.com> Reviewed-by: Paulo Zanoni <paulo.r.zanoni@intel.com> Signed-off-by: Daniel Vetter <daniel.vetter@ffwll.ch>
This commit is contained in:
parent
6ba2bd3da7
commit
559be30cb7
|
@ -41,6 +41,12 @@
|
||||||
|
|
||||||
#define DP_LINK_CHECK_TIMEOUT (10 * 1000)
|
#define DP_LINK_CHECK_TIMEOUT (10 * 1000)
|
||||||
|
|
||||||
|
/* Compliance test status bits */
|
||||||
|
#define INTEL_DP_RESOLUTION_SHIFT_MASK 0
|
||||||
|
#define INTEL_DP_RESOLUTION_PREFERRED (1 << INTEL_DP_RESOLUTION_SHIFT_MASK)
|
||||||
|
#define INTEL_DP_RESOLUTION_STANDARD (2 << INTEL_DP_RESOLUTION_SHIFT_MASK)
|
||||||
|
#define INTEL_DP_RESOLUTION_FAILSAFE (3 << INTEL_DP_RESOLUTION_SHIFT_MASK)
|
||||||
|
|
||||||
struct dp_link_dpll {
|
struct dp_link_dpll {
|
||||||
int link_bw;
|
int link_bw;
|
||||||
struct dpll dpll;
|
struct dpll dpll;
|
||||||
|
@ -4079,6 +4085,39 @@ static uint8_t intel_dp_autotest_video_pattern(struct intel_dp *intel_dp)
|
||||||
static uint8_t intel_dp_autotest_edid(struct intel_dp *intel_dp)
|
static uint8_t intel_dp_autotest_edid(struct intel_dp *intel_dp)
|
||||||
{
|
{
|
||||||
uint8_t test_result = DP_TEST_NAK;
|
uint8_t test_result = DP_TEST_NAK;
|
||||||
|
struct intel_connector *intel_connector = intel_dp->attached_connector;
|
||||||
|
struct drm_connector *connector = &intel_connector->base;
|
||||||
|
|
||||||
|
if (intel_connector->detect_edid == NULL ||
|
||||||
|
connector->edid_corrupt == 1 ||
|
||||||
|
intel_dp->aux.i2c_defer_count > 6) {
|
||||||
|
/* Check EDID read for NACKs, DEFERs and corruption
|
||||||
|
* (DP CTS 1.2 Core r1.1)
|
||||||
|
* 4.2.2.4 : Failed EDID read, I2C_NAK
|
||||||
|
* 4.2.2.5 : Failed EDID read, I2C_DEFER
|
||||||
|
* 4.2.2.6 : EDID corruption detected
|
||||||
|
* Use failsafe mode for all cases
|
||||||
|
*/
|
||||||
|
if (intel_dp->aux.i2c_nack_count > 0 ||
|
||||||
|
intel_dp->aux.i2c_defer_count > 0)
|
||||||
|
DRM_DEBUG_KMS("EDID read had %d NACKs, %d DEFERs\n",
|
||||||
|
intel_dp->aux.i2c_nack_count,
|
||||||
|
intel_dp->aux.i2c_defer_count);
|
||||||
|
intel_dp->compliance_test_data = INTEL_DP_RESOLUTION_FAILSAFE;
|
||||||
|
} else {
|
||||||
|
if (!drm_dp_dpcd_write(&intel_dp->aux,
|
||||||
|
DP_TEST_EDID_CHECKSUM,
|
||||||
|
&intel_connector->detect_edid->checksum,
|
||||||
|
1));
|
||||||
|
DRM_DEBUG_KMS("Failed to write EDID checksum\n");
|
||||||
|
|
||||||
|
test_result = DP_TEST_ACK | DP_TEST_EDID_CHECKSUM_WRITE;
|
||||||
|
intel_dp->compliance_test_data = INTEL_DP_RESOLUTION_STANDARD;
|
||||||
|
}
|
||||||
|
|
||||||
|
/* Set test active flag here so userspace doesn't interrupt things */
|
||||||
|
intel_dp->compliance_test_active = 1;
|
||||||
|
|
||||||
return test_result;
|
return test_result;
|
||||||
}
|
}
|
||||||
|
|
||||||
|
@ -4094,7 +4133,10 @@ static void intel_dp_handle_test_request(struct intel_dp *intel_dp)
|
||||||
uint8_t rxdata = 0;
|
uint8_t rxdata = 0;
|
||||||
int status = 0;
|
int status = 0;
|
||||||
|
|
||||||
|
intel_dp->compliance_test_active = 0;
|
||||||
intel_dp->compliance_test_type = 0;
|
intel_dp->compliance_test_type = 0;
|
||||||
|
intel_dp->compliance_test_data = 0;
|
||||||
|
|
||||||
intel_dp->aux.i2c_nack_count = 0;
|
intel_dp->aux.i2c_nack_count = 0;
|
||||||
intel_dp->aux.i2c_defer_count = 0;
|
intel_dp->aux.i2c_defer_count = 0;
|
||||||
|
|
||||||
|
|
|
@ -740,6 +740,8 @@ struct intel_dp {
|
||||||
|
|
||||||
/* Displayport compliance testing */
|
/* Displayport compliance testing */
|
||||||
unsigned long compliance_test_type;
|
unsigned long compliance_test_type;
|
||||||
|
unsigned long compliance_test_data;
|
||||||
|
bool compliance_test_active;
|
||||||
};
|
};
|
||||||
|
|
||||||
struct intel_digital_port {
|
struct intel_digital_port {
|
||||||
|
|
Loading…
Reference in New Issue