Artem Bityutskiy
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4db451a764
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MTD: tests: add mtd_torturetest
This test is designed to work for very long time and it tries to
wear few eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-10 17:00:40 +02:00 |
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Artem Bityutskiy
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bf60862a58
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MTD: tests: add mtd_subpagetest
This tests makes sure sub-pages on NAND MTD device work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:14 +02:00 |
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Artem Bityutskiy
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7163cea15f
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MTD: tests: add mtd_stresstest
This test just performs random operations on random eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:14 +02:00 |
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Artem Bityutskiy
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72069be936
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MTD: tests: add mtd_speedtest
This test examines I/O speed of the flash device.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:14 +02:00 |
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Artem Bityutskiy
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72091b6889
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MTD: tests: add mtd_readtest
A simple tests which reads whole MTD device one page at a time.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:14 +02:00 |
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Artem Bityutskiy
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e73f217439
|
MTD: tests: add mtd_pagetest
This test checks that NAND pages read/write work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:14 +02:00 |
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Artem Bityutskiy
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e3644da756
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MTD: tests: add mtd_oobtest
This test checks that OOB of a NAND MTD device works fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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2008-12-08 13:56:13 +02:00 |