RNDIS function has a limitation on the number of allowed instances.
So far it has been RNDIS_MAX_CONFIGS, which happens to be one.
In order to eliminate this kind of arbitrary limitation we should not
preallocate a predefined (RNDIS_MAX_CONFIGS) array of struct rndis_params
instances but instead allow allocating them on demand.
This patch allocates struct rndis_params on demand in rndis_register().
Coversly, the structure is free()'d in rndis_deregister().
If CONFIG_USB_GADGET_DEBUG_FILES is set, the proc files are created which
is the same behaviour as before, but the moment of creation is delayed
until struct rndis_params is actually allocated.
rnids_init() and rndis_exit() have nothing to do, so they are eliminated.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Add support for configfs interface so that f_printer can be used as a
component of usb gadgets composed with it.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UVC function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC2 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC1 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SOURCESINK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SERIAL function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test RNDIS function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test PHONET function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test OBEX function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test NCM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MIDI function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MASS STORAGE function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test LOOPBACK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test HID function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test FFS (FunctionFS) function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test EEM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM subset function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
The newly added file will be used to provide descriptions of how to test
the functions of USB gadgets.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Andrzej Pietrasiewicz