mirror of https://gitee.com/openkylin/linux.git
8f40842e42
NAND: * Add sunxi_nand randomizer support * begin refactoring NAND ecclayout structs * fix pxa3xx_nand dmaengine usage * brcmnand: fix support for v7.1 controller * add Qualcomm NAND controller driver SPI NOR: * add new ls1021a, ls2080a support to Freescale QuadSPI * add new flash ID entries * support bottom-block protection for Winbond flash * support Status Register Write Protect * remove broken QPI support for Micron SPI flash JFFS2: * improve post-mount CRC scan efficiency General: * refactor bcm63xxpart parser, to later extend for NAND * add writebuf size parameter to mtdram Other minor code quality improvements -----BEGIN PGP SIGNATURE----- Version: GnuPG v1 iQIcBAABAgAGBQJW9CzVAAoJEFySrpd9RFgtQFwQAJdH0wnsZTYfeqToIaD8yMM4 rtakV/oIMSvMSWuqK+Mx0k6OjGwswgnGZ+tfQLRAYIhb33P8UD0F8Dv5D0x/+zRo EgiDlnss/lliXpbh2u4fsANSpFF/JUPXFqU6NanjqQ1rtvR60LUeKOFEz1NRciuV Ib6oDLFeXQFxwG0J+EBDo5MrT8aiPODtx4TS8VVo0o0y/WLkEujQPP5592TnCPha zX0n9azi26pARo7VLqWjVD8GigY5PadqJAWOZcQr0dGMQv5URtWcCCdThiNsCEzY SW9cYSr4CBdy1FIeoJ47yoBg8aFzhyeeuF1efb1U0MoYVL0rdIbznop3Kwilj48L Rnh4hvKkrTH16rO6RfKm1lIJaJQYKMErXyEceYMIjV91fEL3qhfbU9W6+Q5HT4hY oJmlH+4e/I1Jtf+vW4xFGMYclmYwCO6GJ4HHqnNpby/iH/nZ07hNX3lbxrlqHMwh MrSIidqLTsseXcyHBFc+42AsWs8unaYWVB0N3VFkEgl0BFyPObAtvwnHA6zywMvp EqJijXFG8VPcztE3eTIMbd0WOkxTjpMT6YHzpZqli/ENxCgu79OWELYrJ0/vC5Uj HK0qxgvIzUyJgmikkySDvd/Hc6HWItYonlcAht0VErNfTTfkMwWgRz1W4ZRB6bOJ 7M83aytLyRYaPGEbwaoR =xOlP -----END PGP SIGNATURE----- Merge tag 'for-linus-20160324' of git://git.infradead.org/linux-mtd Pull MTD updates from Brian Norris: "NAND: - Add sunxi_nand randomizer support - begin refactoring NAND ecclayout structs - fix pxa3xx_nand dmaengine usage - brcmnand: fix support for v7.1 controller - add Qualcomm NAND controller driver SPI NOR: - add new ls1021a, ls2080a support to Freescale QuadSPI - add new flash ID entries - support bottom-block protection for Winbond flash - support Status Register Write Protect - remove broken QPI support for Micron SPI flash JFFS2: - improve post-mount CRC scan efficiency General: - refactor bcm63xxpart parser, to later extend for NAND - add writebuf size parameter to mtdram Other minor code quality improvements" * tag 'for-linus-20160324' of git://git.infradead.org/linux-mtd: (72 commits) mtd: nand: remove kerneldoc for removed function parameter mtd: nand: Qualcomm NAND controller driver dt/bindings: qcom_nandc: Add DT bindings mtd: nand: don't select chip in nand_chip's block_bad op mtd: spi-nor: support lock/unlock for a few Winbond chips mtd: spi-nor: add TB (Top/Bottom) protect support mtd: spi-nor: add SPI_NOR_HAS_LOCK flag mtd: spi-nor: use BIT() for flash_info flags mtd: spi-nor: disallow further writes to SR if WP# is low mtd: spi-nor: make lock/unlock bounds checks more obvious and robust mtd: spi-nor: silently drop lock/unlock for already locked/unlocked region mtd: spi-nor: wait for SR_WIP to clear on initial unlock mtd: nand: simplify nand_bch_init() usage mtd: mtdswap: remove useless if (!mtd->ecclayout) test mtd: create an mtd_oobavail() helper and make use of it mtd: kill the ecclayout->oobavail field mtd: nand: check status before reporting timeout mtd: bcm63xxpart: give width specifier an 'int', not 'size_t' mtd: mtdram: Add parameter for setting writebuf size mtd: nand: pxa3xx_nand: kill unused field 'drcmr_cmd' ... |
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| .. | ||
| Makefile | ||
| mtd_nandecctest.c | ||
| mtd_test.c | ||
| mtd_test.h | ||
| nandbiterrs.c | ||
| oobtest.c | ||
| pagetest.c | ||
| readtest.c | ||
| speedtest.c | ||
| stresstest.c | ||
| subpagetest.c | ||
| torturetest.c | ||