mirror of https://gitee.com/openkylin/qemu.git
hw/sd: sd: Skip write protect groups check in sd_erase() for high capacity cards
High capacity cards don't support write protection hence we should not perform the write protect groups check in sd_erase() for them. Signed-off-by: Bin Meng <bin.meng@windriver.com> Reviewed-by: Philippe Mathieu-Daudé <f4bug@amsat.org> Message-Id: <20210216150225.27996-6-bmeng.cn@gmail.com> Signed-off-by: Philippe Mathieu-Daudé <f4bug@amsat.org>
This commit is contained in:
parent
ce6ea2efc5
commit
2473dc4022
18
hw/sd/sd.c
18
hw/sd/sd.c
|
@ -765,6 +765,7 @@ static void sd_erase(SDState *sd)
|
|||
int i;
|
||||
uint64_t erase_start = sd->erase_start;
|
||||
uint64_t erase_end = sd->erase_end;
|
||||
bool sdsc = true;
|
||||
|
||||
trace_sdcard_erase(sd->erase_start, sd->erase_end);
|
||||
if (sd->erase_start == INVALID_ADDRESS
|
||||
|
@ -779,6 +780,7 @@ static void sd_erase(SDState *sd)
|
|||
/* High capacity memory card: erase units are 512 byte blocks */
|
||||
erase_start *= 512;
|
||||
erase_end *= 512;
|
||||
sdsc = false;
|
||||
}
|
||||
|
||||
if (erase_start > sd->size || erase_end > sd->size) {
|
||||
|
@ -788,16 +790,20 @@ static void sd_erase(SDState *sd)
|
|||
return;
|
||||
}
|
||||
|
||||
erase_start = sd_addr_to_wpnum(erase_start);
|
||||
erase_end = sd_addr_to_wpnum(erase_end);
|
||||
sd->erase_start = INVALID_ADDRESS;
|
||||
sd->erase_end = INVALID_ADDRESS;
|
||||
sd->csd[14] |= 0x40;
|
||||
|
||||
for (i = erase_start; i <= erase_end; i++) {
|
||||
assert(i < sd->wpgrps_size);
|
||||
if (test_bit(i, sd->wp_groups)) {
|
||||
sd->card_status |= WP_ERASE_SKIP;
|
||||
/* Only SDSC cards support write protect groups */
|
||||
if (sdsc) {
|
||||
erase_start = sd_addr_to_wpnum(erase_start);
|
||||
erase_end = sd_addr_to_wpnum(erase_end);
|
||||
|
||||
for (i = erase_start; i <= erase_end; i++) {
|
||||
assert(i < sd->wpgrps_size);
|
||||
if (test_bit(i, sd->wp_groups)) {
|
||||
sd->card_status |= WP_ERASE_SKIP;
|
||||
}
|
||||
}
|
||||
}
|
||||
}
|
||||
|
|
Loading…
Reference in New Issue