tools/testing/nvdimm: allow custom error code injection

Given that libnvdimm driver stack takes specific actions on DIMM command
error codes like -EACCES, provide a facility to inject custom failures.

Signed-off-by: Dan Williams <dan.j.williams@intel.com>
This commit is contained in:
Dan Williams 2018-04-09 13:56:43 -07:00
parent e7c5a571a8
commit 55c72ab62e
1 changed files with 37 additions and 1 deletions

View File

@ -138,6 +138,7 @@ static u32 handle[] = {
};
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
static int dimm_fail_cmd_code[NUM_DCR];
struct nfit_test_fw {
enum intel_fw_update_state state;
@ -892,8 +893,11 @@ static int get_dimm(struct nfit_mem *nfit_mem, unsigned int func)
if (i >= ARRAY_SIZE(handle))
return -ENXIO;
if ((1 << func) & dimm_fail_cmd_flags[i])
if ((1 << func) & dimm_fail_cmd_flags[i]) {
if (dimm_fail_cmd_code[i])
return dimm_fail_cmd_code[i];
return -EIO;
}
return i;
}
@ -1225,8 +1229,40 @@ static ssize_t fail_cmd_store(struct device *dev, struct device_attribute *attr,
}
static DEVICE_ATTR_RW(fail_cmd);
static ssize_t fail_cmd_code_show(struct device *dev, struct device_attribute *attr,
char *buf)
{
int dimm = dimm_name_to_id(dev);
if (dimm < 0)
return dimm;
return sprintf(buf, "%d\n", dimm_fail_cmd_code[dimm]);
}
static ssize_t fail_cmd_code_store(struct device *dev, struct device_attribute *attr,
const char *buf, size_t size)
{
int dimm = dimm_name_to_id(dev);
unsigned long val;
ssize_t rc;
if (dimm < 0)
return dimm;
rc = kstrtol(buf, 0, &val);
if (rc)
return rc;
dimm_fail_cmd_code[dimm] = val;
return size;
}
static DEVICE_ATTR_RW(fail_cmd_code);
static struct attribute *nfit_test_dimm_attributes[] = {
&dev_attr_fail_cmd.attr,
&dev_attr_fail_cmd_code.attr,
&dev_attr_handle.attr,
NULL,
};