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rtc: ds1307: add frequency_test_enable attribute on m41txx 

On m41txx you can enable open-drain OUT pin to check if offset is ok.
Enabling OUT pin with frequency_test_enable attribute, OUT pin will tick
512 times faster than 1s tick base.

Enable or Disable FT bit on CONTROL register if freq_test is 1 or 0.

Signed-off-by: Giulio Benetti <giulio.benetti@micronovasrl.com>
Signed-off-by: Alexandre Belloni <alexandre.belloni@bootlin.com>
This commit is contained in:
Giulio Benetti 2018-07-25 19:26:05 +02:00 committed by Alexandre Belloni
parent 79230ff641
commit b41c23e152
1 changed files with 92 additions and 0 deletions
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92
drivers/rtc/rtc-ds1307.c
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@ -1050,6 +1050,94 @@ static int m41txx_rtc_set_offset(struct device *dev, long offset)
ctrl_reg); ctrl_reg);
} }
static ssize_t frequency_test_enable_store(struct device *dev,
struct device_attribute *attr,
const char *buf, size_t count)
{
struct ds1307 *ds1307 = dev_get_drvdata(dev);
bool freq_test_en;
int ret;
ret = kstrtobool(buf, &freq_test_en);
if (ret) {
dev_err(dev, "Failed to store RTC Frequency Test attribute\n");
return ret;
}
regmap_update_bits(ds1307->regmap, M41TXX_REG_CONTROL, M41TXX_BIT_FT,
freq_test_en ? M41TXX_BIT_FT : 0);
return count;
}
static ssize_t frequency_test_enable_show(struct device *dev,
struct device_attribute *attr,
char *buf)
{
struct ds1307 *ds1307 = dev_get_drvdata(dev);
unsigned int ctrl_reg;
regmap_read(ds1307->regmap, M41TXX_REG_CONTROL, &ctrl_reg);
return scnprintf(buf, PAGE_SIZE, (ctrl_reg & M41TXX_BIT_FT) ? "on\n" :
"off\n");
}
static DEVICE_ATTR_RW(frequency_test_enable);
static struct attribute *rtc_freq_test_attrs[] = {
&dev_attr_frequency_test_enable.attr,
NULL,
};
static const struct attribute_group rtc_freq_test_attr_group = {
.attrs = rtc_freq_test_attrs,
};
static void rtc_calib_remove_sysfs_group(void *_dev)
{
struct device *dev = _dev;
sysfs_remove_group(&dev->kobj, &rtc_freq_test_attr_group);
}
static int ds1307_add_frequency_test(struct ds1307 *ds1307)
{
int err;
switch (ds1307->type) {
case m41t0:
case m41t00:
case m41t11:
/* Export sysfs entries */
err = sysfs_create_group(&(ds1307->dev)->kobj,
&rtc_freq_test_attr_group);
if (err) {
dev_err(ds1307->dev,
"Failed to create sysfs group: %d\n",
err);
return err;
}
err = devm_add_action_or_reset(ds1307->dev,
rtc_calib_remove_sysfs_group,
ds1307->dev);
if (err) {
dev_err(ds1307->dev,
"Failed to add sysfs cleanup action: %d\n",
err);
sysfs_remove_group(&(ds1307->dev)->kobj,
&rtc_freq_test_attr_group);
return err;
}
break;
default:
break;
}
return 0;
}
/*----------------------------------------------------------------------*/ /*----------------------------------------------------------------------*/
static int ds1307_nvram_read(void *priv, unsigned int offset, void *val, static int ds1307_nvram_read(void *priv, unsigned int offset, void *val,
@ -1792,6 +1880,10 @@ static int ds1307_probe(struct i2c_client *client,
if (err) if (err)
return err; return err;
err = ds1307_add_frequency_test(ds1307);
if (err)
return err;
if (chip->nvram_size) { if (chip->nvram_size) {
struct nvmem_config nvmem_cfg = { struct nvmem_config nvmem_cfg = {
.name = "ds1307_nvram", .name = "ds1307_nvram",