tools/testing/nvdimm: support nfit_test_dimm attributes under nfit_test.1
The nfit_test.1 bus provides a pmem topology without blk-aperture enabling, so it presents different failure modes for label space handling. Allow custom DSM command error injection. Signed-off-by: Dan Williams <dan.j.williams@intel.com>
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@ -1166,12 +1166,12 @@ static int ars_state_init(struct device *dev, struct ars_state *ars_state)
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static void put_dimms(void *data)
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{
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struct device **dimm_dev = data;
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struct nfit_test *t = data;
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int i;
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for (i = 0; i < NUM_DCR; i++)
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if (dimm_dev[i])
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device_unregister(dimm_dev[i]);
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for (i = 0; i < t->num_dcr; i++)
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if (t->dimm_dev[i])
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device_unregister(t->dimm_dev[i]);
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}
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static struct class *nfit_test_dimm;
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@ -1180,13 +1180,11 @@ static int dimm_name_to_id(struct device *dev)
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{
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int dimm;
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if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1
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|| dimm >= NUM_DCR || dimm < 0)
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if (sscanf(dev_name(dev), "test_dimm%d", &dimm) != 1)
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return -ENXIO;
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return dimm;
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}
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static ssize_t handle_show(struct device *dev, struct device_attribute *attr,
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char *buf)
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{
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@ -1259,7 +1257,6 @@ static ssize_t fail_cmd_code_store(struct device *dev, struct device_attribute *
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}
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static DEVICE_ATTR_RW(fail_cmd_code);
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static struct attribute *nfit_test_dimm_attributes[] = {
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&dev_attr_fail_cmd.attr,
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&dev_attr_fail_cmd_code.attr,
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@ -1276,6 +1273,23 @@ static const struct attribute_group *nfit_test_dimm_attribute_groups[] = {
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NULL,
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};
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static int nfit_test_dimm_init(struct nfit_test *t)
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{
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int i;
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if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t))
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return -ENOMEM;
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for (i = 0; i < t->num_dcr; i++) {
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t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
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&t->pdev.dev, 0, NULL,
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nfit_test_dimm_attribute_groups,
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"test_dimm%d", i + t->dcr_idx);
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if (!t->dimm_dev[i])
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return -ENOMEM;
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}
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return 0;
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}
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static void smart_init(struct nfit_test *t)
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{
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int i;
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@ -1371,17 +1385,8 @@ static int nfit_test0_alloc(struct nfit_test *t)
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if (!t->_fit)
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return -ENOMEM;
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if (devm_add_action_or_reset(&t->pdev.dev, put_dimms, t->dimm_dev))
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if (nfit_test_dimm_init(t))
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return -ENOMEM;
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for (i = 0; i < NUM_DCR; i++) {
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t->dimm_dev[i] = device_create_with_groups(nfit_test_dimm,
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&t->pdev.dev, 0, NULL,
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nfit_test_dimm_attribute_groups,
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"test_dimm%d", i);
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if (!t->dimm_dev[i])
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return -ENOMEM;
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}
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smart_init(t);
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return ars_state_init(&t->pdev.dev, &t->ars_state);
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}
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@ -1413,6 +1418,8 @@ static int nfit_test1_alloc(struct nfit_test *t)
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if (!t->spa_set[1])
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return -ENOMEM;
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if (nfit_test_dimm_init(t))
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return -ENOMEM;
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smart_init(t);
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return ars_state_init(&t->pdev.dev, &t->ars_state);
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}
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